X-Ray Interferometer

All case studies

The XRI is an X-Ray interferometer under development, capable of detecting angular differences as small as 1 millionth of a arcsecond.

This technology is based on the Silicon Pore Optics and is created in cooperation with the Leicester university as an additional configuration for (space based) X-ray telescopes.

Applications

  • Distinction of two close celestial X-Ray sources
  • Exact localization of X-ray sources from a large distance

Media

Images

Facts & figures

Specifications

Material properties identical to Silicon Pore Optics:

  • Very lightweight
  • Very strong
  • Capable of integration of very large lenses (meter scale) and/or very large separation
  • Current angular resolution: 1/1.000.000 arcsec

Availability:
XRI has TRL 3

Delivery time:
Lead time prior to production 10 months.

Main technologies used

The scientific and engineering foundations behind every system.

No technolgies found.

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